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Metrologic Accused Of Patent Infringement


Blackwood, New Jersey – Metrologic Instruments, Inc. (NASDAQ-NMS:MTLG), today announced that on May 10, 2006, PSC Scanning, Inc., a subsidiary of PSC Inc., filed a Complaint against Metrologic Instruments, Inc. in the United States District Court in Oregon. The essence of the claim is that Metrologic’s Stratos product line of bi-optic scanners infringes two PSC patents. The suit seeks equitable relief and damages. Metrologic strongly disputes these claims and intends to vigorously defend this action and its intellectual property.

As reported in our first quarter earnings press release on May 9, 2006, Metrologic continues to show dramatic revenue growth and is gaining market share as verified by independent research organizations, outpacing the industry at large. Our consistent ability to grow sales extends to many product lines across the globe, allowing us to make inroads into markets previously dominated by only one or two manufacturers.

Metrologic’s Stratos product fa

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Did You Know?

A patent protects your invention.

A patent for an invention is a grant of property rights by the U.S. Government through the U.S. Patent and Trademark Office. The patent grant excludes others from making, using, or selling the invention in the United States. The terms "Patent Pending" and "Patent Applied For" are used to inform the public that an application for a patent has been filed. Patent protection does not start until the actual grant of a patent. Marking of an article as patented, when it is not, is illegal and subject to penalty.

Contact our Patent Professionals to ensure you complete the patent filing process correctly or for violation of your patent rights.

 

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 Helpful Patent Terms

Restriction

Definition:
If two or more independent and distinct inventions are claimed in a single application, the examiner may require the applicant to elect (designate) a single invention to which the claims will be restricted.

OG - Patents

Definition:
Official Gazette eOG:P - weekly publication of the USPTO that permits you to browse issued patents and view important notices.

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